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Figure 4
Synchrotron diffraction pattern and calculated diffraction patterns from the Rietveld refined structure for the new high-temperature polymorph of (a) CaZP at 1420 (±2)°C and (b) SrZP at 1409 (±4)°C. Pt is the internal reference material for temperature measurement and ZrP2O7 is a minor phase.

Journal logoSTRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS
ISSN: 2052-5206
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