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Figure 11
(a)–(b) Examples of input experimental reflectivity curves of DIP monolayers grown on top of a silicon/silicon oxide substrate (blue markers) with the corresponding neural network predictions (red lines) for the model with physics-informed parameterization. (c)–(d) Predicted SLD profiles corresponding to the reflectivity curves in the top row.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 57| Part 2| April 2024| Pages 456-469
https://doi.org/10.1107/S1600576724002115
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