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Figure 2
Characterization of cFEG stability. (a) Decay of electron beam intensity after HIGH gun flash. (b) Intensity changes of electron beam measured over a typical period of data collection with application of LOW gun flashes every 4.5 h as indicated by arrows and one HIGH flash, indicated by a thick arrow. (c) Electron beam tilt measured during an experiment shown in panel (b).

IUCrJ
Volume 7| Part 4| July 2020| Pages 707-718
ISSN: 2052-2525
https://doi.org/10.1107/S2052252520006065