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Figure 6
Comparison of simultaneously measured spectra in (a) the FEE and (b) the XPP instrument at 8.33 keV using the (220) reflection of a 20 µm Si crystal bent to 50 mm in radius. (c) Projections for the two measurements showing good agreement.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 23| Part 1| January 2016| Pages 3-9
doi:10.1107/S1600577515022559
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