Coherent X-ray beam metrology using 2D high-resolution Fresnel-diffraction analysis

Ruiz-Lopez, M.; Faenov, A.; Pikuz, T.; Ozaki, N.; Mitrofanov, A.; Albertazzi, B.; Hartley, N.; Matsuoka, T.; Ochante, R.; Tange, Y.; Yabuuchi, T.; Habara, T.; Tanaka, K.A.; Inubushi, Y.; Yabashi, M.; Nishikino, M.; Kawachi, T.; Pikuz, S.; Ishikawa, T.; Kodama, R.; Bleiner, D.

doi:10.1107/S1600577516016568

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

IUCr IT WDC

home archive editors for authors for readers submit subscribe open access

view article

Figure 5
2D experimental diffraction pattern and profiles along the horizontal and vertical directions. Calculated profiles are also shown. The black line is the calculated Gaussian beam $[\sigma]$ = 256 µm of the Fresnel diffraction pattern with approximately 75% coherence. (a) Mask 1: 164 µm × 98 µm, F_h = 6.6, F_v = 2.3. (b) Mask 2: 270 µm × 120 µm, F_h = 17.8, F_v = 3.5.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 24| Part 1| January 2017| Pages 196-204

https://doi.org/10.1107/S1600577516016568

Follow J. Synchrotron Rad.

Search IUCr Journals		doi		Advanced search
Author		volume	page