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Figure 3
(a) XRD image of mCherry crystals with accompanying diffraction pattern. (b) Binary-image ground-truth imageconstructed by setting a threshold of 5 × 105. (c) Location and measurements that were acquired; green = background; yellow = crystal; 30.8% of the image was sampled and 9.03% of the interior of the crystal was measured. (d) Image reconstructed from SLADS measurements in (c). The ND between the ground truth in (b) and reconstructed image in (d) was 4 × 10−3.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 24| Part 1| January 2017| Pages 188-195
https://doi.org/10.1107/S160057751601612X
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