Surface science at the PEARL beamline of the Swiss Light Source

Muntwiler, M.; Zhang, J.; Stania, R.; Matsui, F.; Oberta, P.; Flechsig, U.; Patthey, L.; Quitmann, C.; Glatzel, T.; Widmer, R.; Meyer, E.; Jung, T.A.; Aebi, P.; Fasel, R.; Greber, T.

doi:10.1107/S1600577516018646

Journal of Synchrotron Radiation Journal of
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Figure 11
Normalization procedure of angle-scanned XPD data of h-BN/Ni(111). (a) Measured photoelectron intensity of the N 1s peak versus kinetic energy and emission angle at the normal emission setting of the manipulator. The one-dimensional graph on top shows the integration over the full energy range. (b) Polar angle scan $[I(\alpha,\theta)]$ at $[\varphi]$ = 47° after background subtraction and peak integration in the energy domain. (c) Intensity distribution $[I(\alpha,\theta)]$ averaged over the 21 measured φ positions. (d) Polar scan from panel (b) after normalization.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 24| Part 1| January 2017| Pages 354-366

https://doi.org/10.1107/S1600577516018646

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