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Figure 6
Micro-roughness values of an uncoated super-polished silicon substrate (A) and two Pt-coatings with a thickness of 32 nm (B) and 102 nm (C). The values were measured at three positions on each sample using white-light interferometry with magnifications of 20× (left) and 50× (right).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 25| Part 1| January 2018| Pages 116-122
https://doi.org/10.1107/S1600577517016095
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