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Figure 7
Detailed EUV reflectivity scans inside and outside the l1n9 spots: (a) for Ru an angle of incidence scan at fixed wavelength of 13.5 nm and (b) for Mo/Si a wavelength scan at a fixed angle of incidence of 73.75°.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 25| Part 1| January 2018| Pages 77-84
https://doi.org/10.1107/S1600577517017362
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