The High Energy Density Scientific Instrument at the European XFEL

Zastrau, U.; Appel, K.; Baehtz, C.; Baehr, O.; Batchelor, L.; Berghäuser, A.; Banjafar, M.; Brambrink, E.; Cerantola, V.; Cowan, T.E.; Damker, H.; Dietrich, S.; Di Dio Cafiso, S.; Dreyer, J.; Engel, H.-O.; Feldmann, T.; Findeisen, S.; Foese, M.; Fulla-Marsa, D.; Göde, S.; Hassan, M.; Hauser, J.; Herrmannsdörfer, T.; Höppner, H.; Kaa, J.; Kaever, P.; Knöfel, K.; Konôpková, Z.; Laso García, A.; Liermann, H.-P.; Mainberger, J.; Makita, M.; Martens, E.-C.; McBride, E.E.; Möller, D.; Nakatsutsumi, M.; Pelka, A.; Plueckthun, C.; Prescher, C.; Preston, T.R.; Röper, M.; Schmidt, A.; Seidel, W.; Schwinkendorf, J.-P.; Schoelmerich, M.O.; Schramm, U.; Schropp, A.; Strohm, C.; Sukharnikov, K.; Talkovski, P.; Thorpe, I.; Toncian, M.; Toncian, T.; Wollenweber, L.; Yamamoto, Sh.; Tschentscher, T.

doi:10.1107/S1600577521007335

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Figure 16
Kα fluorescence of a 5 µm Cr foil irradiated by an 10 µm X-ray FEL spot for calibration purposes (black-dashed) with fit (red). The spectral broadening of the lines by the 80 mm radius-of-curvature and 40 µm-thick HAPG crystal is ∼2 eV. Reproduced from Preston et al. (2020

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ISSN: 1600-5775

Volume 28| Part 5| September 2021| Pages 1393-1416

https://doi.org/10.1107/S1600577521007335

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