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Figure 5
Schematic illustration of cryo-ptychography. A small convergent electron beam scans through the specimen (shown within 1 µm hole) at a certain defocus. A high-speed pixelated detector is used for recording diffractograms that are subsequently collected from partially overlapping sample positions.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 28| Part 5| September 2021| Pages 1343-1356
https://doi.org/10.1107/S1600577521007931
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