|
Figure 5
N K-edge XANES spectra measured in TEY mode taken in situ during the growth of Co-N film on a quartz substrate at 300 K using reactive magnetron sputtering. The different growth regions are also shown. |
|
Figure 5
N K-edge XANES spectra measured in TEY mode taken in situ during the growth of Co-N film on a quartz substrate at 300 K using reactive magnetron sputtering. The different growth regions are also shown. |