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Figure 6
N K-edge XANES spectra measured in TEY mode taken in situ during the growth of Ni-N film on a quartz substrate at 300 K using reactive magnetron sputtering. The different growth regions are also shown.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 28| Part 5| September 2021| Pages 1504-1510
https://doi.org/10.1107/S1600577521006822
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